Band alignment of ScxAl1-xN/GaN heterojunctions

Eric N. Jin; Matthew T. Hardy; Alyssa L. Mock; John L. Lyons; Alan R. Kramer; Marko J. Tadjer; Neeraj Nepal; D. Scott Katzer; David J. Meyer

doi:10.1117/12.2579042

6 March 2021 Band alignment of Sc_xAl_1-xN/GaN heterojunctions

Eric N. Jin, Matthew T. Hardy, Alyssa L. Mock, John L. Lyons, Alan R. Kramer, Marko J. Tadjer, Neeraj Nepal, D. Scott Katzer, David J. Meyer

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Proceedings Volume 11686, Gallium Nitride Materials and Devices XVI; 1168622 (2021) https://doi.org/10.1117/12.2579042
Event: SPIE OPTO, 2021, Online Only

Abstract

We determine the band alignment of ScxAl1-xN/GaN heterojunctions at ScN alloy fractions ranging from x = 0.04 to 0.20 using x-ray photoemission spectroscopy, and determine the band gap from spectroscopic ellipsometry. We find a transition from straddling to staggered gap as ScN alloy fraction increases, and show that the experimental results are consistent with first-principles calculations. This crossover from type-I to type-II band alignment shows a degree of freedom for engineering improved heterostructures in ScAlN/GaN-based electronic and optoelectronic devices.

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Eric N. Jin, Matthew T. Hardy, Alyssa L. Mock, John L. Lyons, Alan R. Kramer, Marko J. Tadjer, Neeraj Nepal, D. Scott Katzer, and David J. Meyer "Band alignment of Sc_xAl_1-xN/GaN heterojunctions", Proc. SPIE 11686, Gallium Nitride Materials and Devices XVI, 1168622 (6 March 2021); https://doi.org/10.1117/12.2579042

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