Metasurfaces characterization by quantitative phase imaging with SID4 wavefront sensor

Romain Laberdesque; Samira Khadir; Patrice Genevet; Benoît Wattellier

doi:10.1117/12.2582977

5 March 2021 Metasurfaces characterization by quantitative phase imaging with SID4 wavefront sensor

Romain Laberdesque, Samira Khadir, Patrice Genevet, Benoît Wattellier

Proceedings Volume 11695, High Contrast Metastructures X; 116951H (2021) https://doi.org/10.1117/12.2582977
Event: SPIE OPTO, 2021, Online Only

Abstract

Quantitative phase imaging (QPI) solutions are developed to characterize metasurfaces through single-shot. SID4 wavefront analyzer based on the quadriwave lateral shearing interferometry, is used to provide the quantitative phase information. The work presents the ability of the wavefront sensor to characterize metasurfaces regardless its natures (effective refractive index or Pancharatnam-Berry phase, namely), or its phase functions. Advanced analyses are also performed on MetaLenses such as wavefront, PSF, MTF, Zernike polynomial analysis.

Conference Presentation

Citation Download Citation

Romain Laberdesque, Samira Khadir, Patrice Genevet, and Benoît Wattellier "Metasurfaces characterization by quantitative phase imaging with SID4 wavefront sensor", Proc. SPIE 11695, High Contrast Metastructures X, 116951H (5 March 2021); https://doi.org/10.1117/12.2582977

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available