Presentation + Paper
12 April 2021 Hard x-ray gratings-based phase contrast imaging with a spectroscopic detector
Andrew J. Gilbert, Richard S. Wittman, Luke W. Campbell, Nikhil Deshmukh, Richard E. Jacob, Dustin M. Kasparek, Mital A. Zalavadia, Erin A. Miller
Author Affiliations +
Abstract
Gratings-based phase contrast X-ray imaging provides additional materials signatures in textured media based on the deflection of the X-ray beam. Using this technique with a hard (~160 kVp) X-ray spectrum has shown potential for improved materials discrimination in applications such as explosives detection. Typical phase contrast measurements rely on relatively broad bremsstrahlung spectra, resulting in measurement responses averaged across wide energy ranges. Here, we present results for gratings-based phase contrast measurements using a spectroscopic imaging detector. This allows for direct observation of phase-contrast material cross sections as a function of energy, without the need for a mono-energetic X-ray source. Further, the measurements provide a direct understanding of spectral variations and a technical basis for application of hard X-ray gratings-based phase contrast measurements in the presence of attenuating materials.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew J. Gilbert, Richard S. Wittman, Luke W. Campbell, Nikhil Deshmukh, Richard E. Jacob, Dustin M. Kasparek, Mital A. Zalavadia, and Erin A. Miller "Hard x-ray gratings-based phase contrast imaging with a spectroscopic detector", Proc. SPIE 11738, Anomaly Detection and Imaging with X-Rays (ADIX) VI, 1173803 (12 April 2021); https://doi.org/10.1117/12.2589850
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Phase contrast

Hard x-rays

Imaging spectroscopy

Sensors

Spectroscopy

Phase measurement

X-ray imaging

Back to Top