Abstract
In this talk the potential of laser-driven radiation sources for the analysis of materials is discussed. Non-destructive analytical techniques based on charged particle-induced X-ray emission spectroscopy (EDX, PIXE), neutrons (NAA) and photons (PAA) are well recognized as major tools of materials science. Despite their exceptional capabilities, the further developments of these materials characterization techniques have been prevented for several decades by the limits of the adopted particle sources. Because of their potential compactness and versatility, laser-driven radiation sources may offer a major breakthrough with respect to conventional accelerators. A unique feature is represented by the possibility of generating different radiation sources with minor variations in the setup. As a consequence, laser-driven particles could play a pivotal role in materials science applications [1], as shown by results on the possibility to exploit laser-driven ion sources for these purposes [2]. Here we present a complete experimental and theoretical investigation aimed at performing a combined laser-driven Energy Dispersive X-ray spectroscopy and quantitative laser-driven Particle Induced X-ray Emission analysis [3]. We also show the results of theoretical investigations focused on other applications like the Neutron Activation Analysis and the Photon Activation Analysis techniques. The experiments have been carried out at the Centro de Láseres Pulsados (CLPU) in Salamanca with the 200 TW VEGA-2 laser. We consider a case study of particular interest, i.e. the analysis of a non-homogeneous sample, constituted by a micrometric surface layer and a thick substrate. We perform sample irradiation either with both electrons and protons (fig. 1A) or only with protons (fig. 1B). We show that the X-ray production is dominated by the electrons in the first configuration and it can be exploited to easily identify the elements, leading to the demonstration of a laser-driven EDX characterization. Then, we exploit the second configuration to estimate the layer thickness via laser-driven PIXE quantitative analysis. We also show the results from a theoretical investigation aimed at assessing the applicability of laser-driven sources to PAA and NAA studies. By coupling analytical modelling, Particle-In-Cell and Monte Carlo simulations, we show that the use of advanced double-layer targets and suitable converters can allow to exploit the laser-driven protons and electrons for the generation of neutrons and photons required by such applications. These results provide new perspectives toward the development of versatile particle acceleration systems for multiple materials science studies.  [1] M. Passoni, et al., Advanced laser-driven ion sources and their applications in materials and nuclear science, Plasma Phys. Control. Fusion, 14022, (2019), 62 [2] M. Barberio, et al., Laser-Accelerated Proton Beams as Diagnostics for Cultural Heritage, Sci. Rep., 40415, (2017), 7; M. Passoni, et al., Superintense laser-driven ion beam analysis, Sci. Rep., 9.1, (2019), 1 [3] F. Mirani, et al., Integrated quantitative PIXE analysis and EDX spectroscopy using a laser-driven particle source. Sci. Adv. 7, eabc8660 (2021). Co-Authors list: F. Mirani1, A. Maffini1, F. Casamichiela1, A. Pazzaglia1, A. Formenti1, D. Dellasega1, V. Russo1, D. Vavassori1, D. Bortot1, M. Huault2,3, G. Zeraouli2,3, V. Ospina2,3,4, S. Malko2,3, J. I. Apiñaniz2, J. A. Pérez-Hernández2, D. De Luis2, G. Gatti2, L. Volpe2,4, A. Pola1 and D. Calzolari1 1Politecnico di Milano, Via Ponzio 34/3, I-20133 Milan, Italy. 2Centro de Láseres Pulsados, Edicio M5. Parque Científico, Salamanca, Spain. 3Universidad de Salamanca, Patio de Escuelas 1, 37008 Salamanca, Spain 4Université de Bordeaux, CNRS, CEA-DAM/DIF, CELIA, UMR 5107, Talence, France
Conference Presentation
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Matteo Passoni "Nondestructive materials analysis using a laser-driven particle source", Proc. SPIE 11790, Applying Laser-driven Particle Acceleration II, Medical and Nonmedical Uses of Distinctive Energetic Particle and Photon Sources: SPIE Optics + Optoelectronics Industry Event, 117900I (18 April 2021); https://doi.org/10.1117/12.2596513
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