PROCEEDINGS VOLUME 1180
OE/FIBERS '89 | 5-7 SEPTEMBER 1989
Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
Editor(s): Shekhar G. Wadekar
Editor Affiliations +
IN THIS VOLUME

1 Sessions, 19 Papers, 0 Presentations, 0 Posters
All Papers  (19)
OE/FIBERS '89
5-7 September 1989
Boston, United States
All Papers
Joyce Kilmer, B. A. Mortimer
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963451
Jo Permien, Randall Higgins
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963452
Eugene Edwards, Jack Horton, Paul B. Ruffin
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963453
Chun Keung Hui, Neil Kamikawa, Ken Yamada
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963454
Robert H. Jones
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963455
Jeffrey W. Griffin, Richard A. Craig, Kurt A. Stahl
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963456
Ajay Luthra, Dean Messing
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963457
R. Neumann, A. Allen, J. Levy, J. Hayes
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963458
Paul Ruffin, Walter Frost, Wayne Long, Xiaoling Fan
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963459
S. C. Fleming
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963460
D. R. Maack, M. Corke, A. Hu, L. Sawyer, S. Steele
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963461
M. Kesler, G. Arjavalingam
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963462
Kenneth Kaufmann, Mitsuharu Miwa, Paul Roehrenbeck
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963463
Peter Wolf, Ronald F. Broom
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963464
Richard J.S. Bates
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963465
Shlomo Ovadia, W. D. Corti, G. May
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963466
Peter L. Fuhr, Betty Lise Anderson, Paul W. Pastel, Thomas A. Maufer
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963467
J. T. Orosz, J. L. Tode, E. G. Vaerewyck
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963468
M. S. Ner, C. Sharp, D. R. Gibson
Proceedings Volume Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (1990) https://doi.org/10.1117/12.963469
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