Presentation + Paper
23 August 2021 Impact of annealing on performance of X-ray mirror coatings for Athena
P. L. Henriksen, D. D. M. Ferreira, S. Massahi, S. Svendsen, N. C. Gellert, F. E. Christensen, A. S. Jegers, B. Landgraf, A. Thete, M. Collon, E. Handick, L. Cibik, M. Krumrey, C. Gollwitzer, I. Ferreira, B. Shortt, M. Bavdaz
Author Affiliations +
Abstract
As part of the manufacturing process of mirror modules for the Athena X-ray telescope, Silicon Pore Optics plates are assembled into mirror module stacks. The plates that form each stack are held together by direct bonding, relying on van der Waals forces and covalent bonds for adhesion. One way to increase the strength of the covalent bonds is through annealing of the mirror stacks. It is of critical importance to the mission to ensure compatibility between the reflective coating and any post-coating processing of the plates. We present our findings of the impact of annealing on the X-ray re ectance of coated mirrors relevant for the Athena mission. These are Ir single layers, as well as Ir/B4C, Ir/SiC, and Ir/C bilayers. We investigate the effect on the performance of the coatings after annealing at atmospheric pressure and at a low vacuum using X-ray reflectometry. B4C is found to suffer degradation from annealing under atmospheric conditions but not when annealed in vacuum. All other materials investigated are robust to atmospheric annealing.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. L. Henriksen, D. D. M. Ferreira, S. Massahi, S. Svendsen, N. C. Gellert, F. E. Christensen, A. S. Jegers, B. Landgraf, A. Thete, M. Collon, E. Handick, L. Cibik, M. Krumrey, C. Gollwitzer, I. Ferreira, B. Shortt, and M. Bavdaz "Impact of annealing on performance of X-ray mirror coatings for Athena", Proc. SPIE 11822, Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, 118220D (23 August 2021); https://doi.org/10.1117/12.2594559
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KEYWORDS
Annealing

Reflectivity

X-rays

Mirrors

Data modeling

Scattering

Silicon

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