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12 April 1990 Phase Retardation Measurement For Simple Kinoform Technology
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Proceedings Volume 1183, Holography '89; (1990) https://doi.org/10.1117/12.963886
Event: Holography '89, 1989, Varna, Bulgaria
Abstract
The paper presents a new technique of quantitative performing of kinoforms. During preparing the kinoform a photochemical operations have been used. The phase retardation in each zone is controlled by a new diffraction technique. A standard photographic plate glass substrate is sufficient for described method.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maciej Sypek "Phase Retardation Measurement For Simple Kinoform Technology", Proc. SPIE 1183, Holography '89, (12 April 1990); https://doi.org/10.1117/12.963886
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