Analytic von Hamos geometry optimization and calibration

Franklin D. Fuller; Chantal Mustoe; Uwe Bergmann; Roberto Alonso-Mori; Dimosthenis Sokaras; Ichiro Inoue; Jumpei Yamada; Taito Osaka

doi:10.1117/12.2594019

1 September 2021 Analytic von Hamos geometry optimization and calibration

Franklin D. Fuller, Chantal Mustoe, Uwe Bergmann, Roberto Alonso-Mori, Dimosthenis Sokaras, Ichiro Inoue, Jumpei Yamada, Taito Osaka

Author Affiliations +

Proceedings Volume 11838, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXIII; 118380V (2021) https://doi.org/10.1117/12.2594019
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States

Abstract

We present an analytic method for the calibration of X-ray fluorescence spectra collected using cylindrically bent crystal analyzers in any arrangement with respect to the sample and detector. Cylindrically bent analyzers are often used in the von Hamos geometry at X-ray Free Electron Lasers to image and disperse fluorescence from a point source to an easily calibrated line. When not in the von Hamos configuration, cylindrically bent analyzers produce spatio-spectral patterns that cannot be calibrated using existing methods. Our formula allows us to rapidly fit and optimize geometric parameters for fluorescence data and calibrate the resulting spectra.

Conference Presentation

Citation Download Citation

Franklin D. Fuller, Chantal Mustoe, Uwe Bergmann, Roberto Alonso-Mori, Dimosthenis Sokaras, Ichiro Inoue, Jumpei Yamada, and Taito Osaka "Analytic von Hamos geometry optimization and calibration", Proc. SPIE 11838, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXIII, 118380V (1 September 2021); https://doi.org/10.1117/12.2594019

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