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28 October 2021 High resolution Shack Hartmann wavefront sensor with linearized focal plane technique (LIFT) and its applications
Xavier Levecq, Pauline Treimany, Philippe Clémenceau
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Proceedings Volume 11889, Optifab 2021; 118891J (2021) https://doi.org/10.1117/12.2606197
Event: SPIE Optifab, 2021, Rochester, New York, United States
Abstract
We will present a new approach of linearized focal plane technique (LIFT), formerly developed by ONERA, which results in an improvement of a factor of 16 (4x4) of the spatial resolution. This technology is based on the combination of standard SH technology with phase retrieval algorithms applied on all spots of the microlens array that provides information on high spatial frequencies. We will show some measurements performed on extremely complex wavefronts. This technology presents very promising perspectives for optical and freeform metrology and can advantageously replace, at lower cost and better usability, Fizeau interferometry : insensitivity to vibrations, multi-wavelengths compatibility, lambda/100 accuracy and a wide dynamic range are, in fact, intrinsic characteristics of this technology.
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Xavier Levecq, Pauline Treimany, and Philippe Clémenceau "High resolution Shack Hartmann wavefront sensor with linearized focal plane technique (LIFT) and its applications", Proc. SPIE 11889, Optifab 2021, 118891J (28 October 2021); https://doi.org/10.1117/12.2606197
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KEYWORDS
Wavefront sensors
Spatial resolution
Wavefronts
Microlens
New and emerging technologies
Phase retrieval
Sensors
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