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Perovskites have been widely used in solar cells manufacturing due to their extraordinary photoelectric characteristics. The crystal quality of perovskite plays an important role in photoelectric conversion. Although conventional crystal quality detection methods, such as scanning electron microscopy(SEM) and atomic force microscope(AFM), have good performance of high spatial resolution, they are usually time-consuming, expensive, and sometimes damage the samples unavoidably. Hyperspectral imaging(HSI) technology has been utilized to monitor material growth process in recent years, due to its advantages of high spectral resolution, non-invasive and fast detection speed. Micro-hyperspectral imaging(MHSI) technology combines both HSI and microscopic technology, enabling it suitable for micro- and nanoscale material analysis. In this work, we have developed a kind of MHSI system. 3D data of perovskite monocrystals were obtained by transmission mode at room temperature. Perovskite mono-crystals were prepared by one-step solution self-assembly method. The experimental results illustrate that the specific absorption wavelength of perovskite is directly proportional to the thickness of mono-crystals. When the thickness increases, the absorption wavelength will shift red. The thickness factor is also verified by white light interference. The composition ratio of perovskite monocrystals has a certain dependence on its absorbance before 540 nm. The higher the proportion of Br atom is, the weaker the light absorption is, and auxiliary verification was carried out by energy dispersive spectrometer(EDS). In conclusion, MHSI technology can effectively monitor and analyze the preparation process and quality evaluation of micro- and nanoscale materials and structure, it shows a wide application prospect in material science and medical fields.
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