Paper
23 August 2021 Birefringence mapping of optical material by use of supercontinuum vector beams
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Abstract
We demonstrate a supercontinuum vector beam analysis based on interactions between angular-variant polarization and birefringence in the solid state. The supercontinuum vector beam analysis provides both the two-dimensional distribution of the birefringence and the wavelength properties, from a single-shot image. The angular resolutions of the retardance and azimuthal angle are evaluated. The retardances were determined at 650 nm to be 92.9° ± 9.3° and 87.1° ± 18.7°, respectively. The spatial resolution of 60 μm and the resolution of the retardance was 12 mrad.
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Juri Ogawa, Misaki Shoji, Ryo Kageyama, Toshitaka Wakayama, and Takeshi Higashiguchi "Birefringence mapping of optical material by use of supercontinuum vector beams", Proc. SPIE 11908, Photomask Japan 2021: XXVII Symposium on Photomask and Next-Generation Lithography Mask Technology, 119080Q (23 August 2021); https://doi.org/10.1117/12.2601123
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