Paper
27 October 2021 Ellipsometric characterizations of individual nanoform structures
Tim Kaeseberg, Jana Grundmann, Sven Teichert, Matthias Wurm, Thomas Siefke, Stefanie Kroker, Bernd Bodermann
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Abstract
Spectroscopic polarization measurement and control using channeled spectrum has several unique features and is useful for various spectroscopic instruments. It utilizes the strong dispersion characteristics in polarization retardation of high-order retarders so that the polarization modulation can be made without using mechanical or active elements for polarization modulation. In this presentation, we describe its principle, basic features, and several applications including a spectroscopic ellipsometer and ultrafast rotations of beam profile and polarization.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tim Kaeseberg, Jana Grundmann, Sven Teichert, Matthias Wurm, Thomas Siefke, Stefanie Kroker, and Bernd Bodermann "Ellipsometric characterizations of individual nanoform structures", Proc. SPIE 11927, Optical Technology and Measurement for Industrial Applications Conference 2021, 119270O (27 October 2021); https://doi.org/10.1117/12.2616273
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KEYWORDS
Ellipsometry

Polarization

Nanostructures

Cameras

Imaging systems

Objectives

Optical testing

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