A method for on-line monitoring and fault positioning of abnormality in multi-epitope voltage-withstand test device

Lixin Wang; Shuming Shen; Mihui Jiang; Chen Li; Yongjin Xu; Jifan Lv; Shen Ye; Yangxin Jin

doi:10.1117/12.2612323

4 October 2021 A method for on-line monitoring and fault positioning of abnormality in multi-epitope voltage-withstand test device

Lixin Wang, Shuming Shen, Mihui Jiang, Chen Li, Yongjin Xu, Jifan Lv, Shen Ye, Yangxin Jin

Author Affiliations +

Proceedings Volume 11929, International Workshop on Automation, Control, and Communication Engineering (IWACCE 2021); 119290B (2021) https://doi.org/10.1117/12.2612323
Event: International Workshop on Automation, Control, and Communication Engineering, 2021, Virtual Event, China

Abstract

There is a certain lag in the conventional means of measurement and supervision, periodic system inspection, equipment maintenance, etc., so the on-line verification of equipment cannot be achieved. At the same time, the voltage-withstand test is a key link of the project verification, and its results indicate the insulation level and safety performance of the tested samples. The abnormality in device will cause loss of control of the test results, missed inspections, false inspections, etc., and damage to the tested samples and the equipment itself. In this paper, a method for on-line monitoring and fault positioning of abnormality in multi-epitope voltage-withstand test device is proposed. By collecting the leakage current in the same batch of meter voltage-withstand test and comparing the consistency and difference of the characteristic distribution of leakage current among different epitopes, the running state of the device can be monitored online, fault positioning and abnormal diagnosis can be realized. the method proposed in this paper is verified by actual test data.

Citation Download Citation

Lixin Wang, Shuming Shen, Mihui Jiang, Chen Li, Yongjin Xu, Jifan Lv, Shen Ye, and Yangxin Jin "A method for on-line monitoring and fault positioning of abnormality in multi-epitope voltage-withstand test device", Proc. SPIE 11929, International Workshop on Automation, Control, and Communication Engineering (IWACCE 2021), 119290B (4 October 2021); https://doi.org/10.1117/12.2612323

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