A structured illumination microscopy module using two micro-electromechanical system scanning micromirrors

Peter W. Tinning; Mark Donnachie; Jay L. Christopher; Deepak Uttamchandani; Ralf Bauer

doi:10.1117/12.2608564

2 March 2022 A structured illumination microscopy module using two micro-electromechanical system scanning micromirrors

Peter W. Tinning, Mark Donnachie, Jay L. Christopher, Deepak Uttamchandani, Ralf Bauer

Proceedings Volume 11967, Single Molecule Spectroscopy and Superresolution Imaging XV; 1196706 (2022) https://doi.org/10.1117/12.2608564
Event: SPIE BiOS, 2022, San Francisco, California, United States

Abstract

We present the development and application of a novel structured illumination microscope (SIM) in which the grating pattern is generated using two optical beams controlled via two micro-electro-mechanical system (MEMS) 3D scanning micromirrors, each having static angular and piston control. This arrangement enables the generation of a fully controllable spatial interference pattern at the focal plane by adjusting the positions of the beams in the back-aperture of a high numerical aperture (NA) microscope objective. The utilization of MEMS micromirrors to control angular, radial and phase positioning for the structured illumination patterns has advantages of flexible control of the fluorescence excitation illumination, with achromatic beam delivery through the same optical path, reduced spatial footprint and cost-efficient integration.

Conference Presentation

Citation Download Citation

Peter W. Tinning, Mark Donnachie, Jay L. Christopher, Deepak Uttamchandani, and Ralf Bauer "A structured illumination microscopy module using two micro-electromechanical system scanning micromirrors", Proc. SPIE 11967, Single Molecule Spectroscopy and Superresolution Imaging XV, 1196706 (2 March 2022); https://doi.org/10.1117/12.2608564

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