Research based on color uniformity of semiconductor laser

Jie Liu; Zhihao Quan; Jian Zhong

doi:10.1117/12.2604423

13 December 2021 Research based on color uniformity of semiconductor laser

Jie Liu, Zhihao Quan, Jian Zhong

Proceedings Volume 12074, 10th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Novel Optoelectronic Functional Materials and Devices; 1207403 (2021) https://doi.org/10.1117/12.2604423
Event: Tenth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2021), 2021, Chengdu, China

Abstract

In recent years, the Laser display has drawn wide attention due to its large color gamut and high brightness. However, the poor uniformity of color and illumination induced by the monochromatic laser has become an urgent technical problem to solve. In this work, we designed a new optical illumination frame, added a Gaussian 2° diffuser at the diffuse 1 position, expanded and shimmed the laser beam, and uniquely added an achromatic half-wave plate in front of the two red array lasers. To verify the improvement of this optical illumination frame on the illumination and color uniformity, we built a laser illumination system by using a Hitachi NUMM31 model 4*7 array laser, 639nm, 643nm 2*7 red array laser, 525nm 1*7 green array laser, and 465nm 1*7 blue array laser. Moreover, the simulation of color uniformity was conducted by lighttools. The result of color uniformity is Δx=0.08 and Δy=0.01. As a result, the color uniformity of our new optical illumination frame below 0.015 was achieved, while the color uniformity of Hisense products is 0.025. This newly developed optical illumination frame has the high potential to provide a facile pathway to realize high color and illumination uniformity by using diffusers and an achromatic half-wave plate.

Citation Download Citation

Jie Liu, Zhihao Quan, and Jian Zhong "Research based on color uniformity of semiconductor laser", Proc. SPIE 12074, 10th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Novel Optoelectronic Functional Materials and Devices, 1207403 (13 December 2021); https://doi.org/10.1117/12.2604423

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Diffusers

Semiconductor lasers

Diffusion

Light sources

Light valves

Projection systems

Digital micromirror devices

Show All Keywords

Keywords/Phrases

Search In:

Publication Years