1 April 1990 Time-resolved fluorescence studies of surface recombination in CdSe electrodes
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Abstract
Fluorescence decay profiles are used to monitor carrier dynamics at the interface between single crystalline CdSe electrodes and 0.5M KOH solution. The fluorescence decay profiles are found to be independent of temperature over the range from 277K to 337K. It is also shown that a diffusion model of the carrier dynamics with a single rate constant for surface recombination does not adequately describe the observed dynamics.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. L. Shumaker, D. Burdelski, and David H. Waldeck "Time-resolved fluorescence studies of surface recombination in CdSe electrodes", Proc. SPIE 1209, Picosecond and Femtosecond Spectroscopy from Laboratory to Real World, (1 April 1990); doi: 10.1117/12.17895; https://doi.org/10.1117/12.17895
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