Design, analysis, and testing of x-ray mirror modules

Peter M. Solly; Michael Biskach; Kai-Wing Chan; James Mazzarella; Ryan E. McClelland; Raul Riveros; Timo T. Saha; William W. Zhang

doi:10.1117/12.2629536

31 August 2022 Design, analysis, and testing of x-ray mirror modules

Peter M. Solly, Michael Biskach, Kai-Wing Chan, James Mazzarella, Ryan E. McClelland, Raul Riveros, Timo T. Saha, William W. Zhang

Author Affiliations +

Proceedings Volume 12181, Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray; 121814O (2022) https://doi.org/10.1117/12.2629536
Event: SPIE Astronomical Telescopes + Instrumentation, 2022, Montréal, Québec, Canada

Abstract

The construction of x-ray telescopes that exhibit both high resolution and a low mass to effective area ratio poses many unique challenges. As the development of lightweight silicon x-ray mirrors approaches sub-arc-second resolution, previously inconsequential effects and complications must be addressed. This paper will address the structural analysis methods and experimental data that has been collected in attempts to address and resolve these issues for silicon mirror modules. Various parameters are run through trade space using finite element (FE) models and ray trace algorithms in attempts to contribute to the understanding of challenging and extremely sensitive conditions. Results and experimental data are then used to guide the on-going development of optics modules meeting the requirements of ambitious future x-ray missions. In this paper we discuss how the stringent distortion requirements of a high-resolution telescope are combined with launch vibration strength requirements to design optimized mirror modules.

Citation Download Citation

Peter M. Solly, Michael Biskach, Kai-Wing Chan, James Mazzarella, Ryan E. McClelland, Raul Riveros, Timo T. Saha, and William W. Zhang "Design, analysis, and testing of x-ray mirror modules", Proc. SPIE 12181, Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, 121814O (31 August 2022); https://doi.org/10.1117/12.2629536

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KEYWORDS

Mirrors

Distortion

Epoxies

X-rays

Silicon

Finite element methods

X-ray optics

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