Presentation + Paper
3 October 2022 Scanning Shack-Hartmann sensor for wavefront measurements on freeform optics
Martin Fuerst, Nikolaus Berlakovich, Ernst Csencsics, Georg Schitter
Author Affiliations +
Abstract
The Shack-Hartmann wavefront sensor has the potential to directly characterize the optical performance of a freeform part by measuring the wavefront transmitted or re ected by the part. However, the traditional Shack- Hartmann sensor's small dynamic range and aperture limit its applicability on strongly curved or extended freeform parts. The combination of a Shack-Hartmann sensor with a highly precise positioning system and a suitable registration algorithm can overcome these limitations. This paper presents an integrated and fully automated measurement system that is based on a scanning Shack-Hartmann sensor, demonstrates the enabled dynamic range extension, and presents measurement results obtained from a microscope objective with a numerical aperture of 0.65. The results show the capability of measuring a wavefront with an opening angle of ±80° and detecting an rms wavefront error of 0:28 λ.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Martin Fuerst, Nikolaus Berlakovich, Ernst Csencsics, and Georg Schitter "Scanning Shack-Hartmann sensor for wavefront measurements on freeform optics", Proc. SPIE 12221, Optical Manufacturing and Testing XIV, 122210T (3 October 2022); https://doi.org/10.1117/12.2628328
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Wavefronts

Sensors

Wavefront sensors

Microscopes

Freeform optics

Image registration

Optical testing

RELATED CONTENT

High-NA metrology and sensing on Berkeley MET5
Proceedings of SPIE (March 27 2017)
HHG beam wavefront measurement by XUV PDI sensor
Proceedings of SPIE (September 09 2010)
Figures of merit for laser beam quality
Proceedings of SPIE (April 22 1993)

Back to Top