Presentation + Paper
30 September 2022 Infrared spectral responses of the Ocean Color Instrument (OCI) pre-assembly and integration
Jacob K. Hedelius, Kenneth J. Squire, James Q. Peterson, Branimir Blagojević, Ulrik B Gliese, Eric T. Gorman, David K. Moser, Zakk Rhodes, Pedro Sevilla, Gerhard Meister
Author Affiliations +
Abstract
Spectral characterizations were made of the Ocean Color Instrument (OCI) short-wave infrared (SWIR) Detection Subassembly (SDS) responses (940–2260 nm) prior to their integration. Using modulated output light from a Fourier transform spectrometer, the in-band relative spectral responses of the nine different configurations of SDSs were found along with out-of-band (OOB) sensitivity. From these spectral responses, the center wavelengths (λ0), full widths at half of the maximum, full widths at 1% of the maximum, and OOB rejection ratios were determined. All spectral parameters are within requirements. There are 2–8 repeats of each configuration, and the 1 σ spread among repeats is largest for the 1250 nm and 1615 nm high-gain configurations and is greater than 1 nm. The engineering requirement is for these values to be within ±4 nm and ±10 nm, respectively, of the nominal λ0. There is also a λ0 temperature dependence, which is expected. This temperature dependence is nearly a linear function of wavelength with a 9.5 × 10−3 nm K−1 relationship on average.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jacob K. Hedelius, Kenneth J. Squire, James Q. Peterson, Branimir Blagojević, Ulrik B Gliese, Eric T. Gorman, David K. Moser, Zakk Rhodes, Pedro Sevilla, and Gerhard Meister "Infrared spectral responses of the Ocean Color Instrument (OCI) pre-assembly and integration", Proc. SPIE 12232, Earth Observing Systems XXVII, 1223210 (30 September 2022); https://doi.org/10.1117/12.2631201
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KEYWORDS
Sensors

Short wave infrared radiation

Clouds

Data acquisition

Infrared radiation

Spectroscopy

Signal to noise ratio

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