Conductivity and low frequency noise in VOx thin films

M. S. Harcrow; C. L. Littler; U. Philipose; B. Western; V. Lopes; A. J. Syllaios

doi:10.1117/12.2632758

30 September 2022 Conductivity and low frequency noise in VOx thin films

M. S. Harcrow, C. L. Littler, U. Philipose, B. Western, V. Lopes, A. J. Syllaios

Proceedings Volume 12234, Infrared Sensors, Devices, and Applications XII; 1223405 (2022) https://doi.org/10.1117/12.2632758
Event: SPIE Optical Engineering + Applications, 2022, San Diego, California, United States

Abstract

The electrical conductivity, temperature coefficient of resistance (TCR), and electrical low frequency noise in VOx thin films were investigated. The electrical conduction is found to be dominated by Variable Range Hopping (VRH). Phenomenological relations between resistivity, TCR, and low frequency noise were determined for VOx films over a wide range of resistivities. It was observed that both TCR and noise increase monotonically with resistivity, as expected for VRH conduction.

Conference Presentation

Citation Download Citation

M. S. Harcrow, C. L. Littler, U. Philipose, B. Western, V. Lopes, and A. J. Syllaios "Conductivity and low frequency noise in VOx thin films", Proc. SPIE 12234, Infrared Sensors, Devices, and Applications XII, 1223405 (30 September 2022); https://doi.org/10.1117/12.2632758

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