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With the progression of deep learning algorithms in computer vision, a lot of research is taking place in the semiconductor industry towards improving real-time defect detection and classification analysis. An Automated Defect Classification and Detection (ADCD) framework not only enables rapid measurement of dimensions and classification of defects, but also helps minimize production costs, engineering time as well as tool cycle time associated with the defect inspection process. As we continue to shrink the pitch (below 36nm), defect characterization at wafer scale becomes a key issue as it demands rapid measurement but without losing accuracy and repeatability. Also, in the context of high NA lithography (thin resist), accurate metrology becomes difficult with very noisy as well as low contrast images (No BKM exists till now). Human eyes generally demonstrate close to the Bayesian Error limit in detecting smaller objects (for example, extracting contextual information instantaneously from nanoscale defects in SEM images). However, for most One-stage and Two-stage object detectors, this is still a very challenging task due to variable image resolution and SEM (scanning electron microscope) image quality (low SNR). In this research work, we have experimented with different modified YOLOv5 object detectors to improve challenging stochastic defect detection precision. In this work, we have proposed an ensemble strategy by empirically combining multiple custom-trained models (YOLOv5n, YOLOv5s, YOLOv5m, YOLOv5l, and YOLOv5x) together at the test and inference time. We have noticed four YOLOv5 architecture variants are outperforming against our previous Ensemble ResNets model with improvements of the average precision metric (AP) of the most difficult defect classes as p gap and microbridges as well as overall mAP accuracy. With Ensemble YOLOv5, the p gap AP and microbridge AP metrices have been improved by 35% and 25.33%, respectively, whereas the overall mAP has been improved by 6.25%. The proposed Automated Defect Classification and Detection (ADCD) framework can also be used for high resolution and high-speed metrology, providing rapid identification of defects with improved certainty and further root cause investigation.
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