Paper
19 October 2022 A novel method for dielectric constants extraction and material thickness derivation
Jingxue Zhang, Zhiping Li, Yao Li, Jungang Miao
Author Affiliations +
Proceedings Volume 12294, 7th International Symposium on Advances in Electrical, Electronics, and Computer Engineering; 122940M (2022) https://doi.org/10.1117/12.2641175
Event: 7th International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE 2022), 2022, Xishuangbanna, China
Abstract
A novel method is proposed in this paper for extracting dielectric constants of non-magnetic materials and deriving material thickness. The extraction process is independent of thickness and does not have ambiguous value. Then the thickness derivation is conveniently based on the calculated dielectric constants. The proposed method is validated by simulation data and achieves reliable dielectric constants and material thickness value. It is verified in the waveguide measurement system and also suitable for coaxial line and free space measurement. This method is appropriate for materials whose properties are unknown or thickness cannot be exactly measured.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jingxue Zhang, Zhiping Li, Yao Li, and Jungang Miao "A novel method for dielectric constants extraction and material thickness derivation", Proc. SPIE 12294, 7th International Symposium on Advances in Electrical, Electronics, and Computer Engineering, 122940M (19 October 2022); https://doi.org/10.1117/12.2641175
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KEYWORDS
Dielectrics

Scattering

Waveguides

Electronics

Calibration

Electronics engineering

Free space

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