Paper
19 October 2022 Research and application of x-ray intensity grading imaging technology in high voltage cable detection
Lixin Jiao, Wei Wang, Haidan Lin, Jingyao Luan, Junbo Liu, Changlong Gao, Jianping Lie, Guimei Liu
Author Affiliations +
Proceedings Volume 12294, 7th International Symposium on Advances in Electrical, Electronics, and Computer Engineering; 122942F (2022) https://doi.org/10.1117/12.2640657
Event: 7th International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE 2022), 2022, Xishuangbanna, China
Abstract
With the continuous improvement of urbanization, the cable rate of urban power grid continues to rise, the dense laying of high-voltage cables of various voltage levels in the same channel continues to increase, and the requirements for safe operation of cables are becoming higher and higher. The existing detection methods can not effectively find the problems of cables in the handover and operation stage in time, and there is a lack of on-site rapid detection and defect evaluation method, X-ray imaging detection technology has become the first choice for the internal defect detection method of XLPE insulated high-voltage cable. Because one exposure imaging can only obtain the gray defect information of one energy level in the detection process, it brings inconvenience to the cable detection work in high-intensity and complex environment. This paper proposes the application of X-ray intensity graded imaging detection method to cable flaw detection, the imaging quality and identification ability of X-ray detection of high-voltage cable defects are improved.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lixin Jiao, Wei Wang, Haidan Lin, Jingyao Luan, Junbo Liu, Changlong Gao, Jianping Lie, and Guimei Liu "Research and application of x-ray intensity grading imaging technology in high voltage cable detection", Proc. SPIE 12294, 7th International Symposium on Advances in Electrical, Electronics, and Computer Engineering, 122942F (19 October 2022); https://doi.org/10.1117/12.2640657
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KEYWORDS
X-rays

X-ray imaging

X-ray detectors

Image quality

Image fusion

Aluminum

Digital x-ray imaging

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