1 July 1990 A research on ultrafast scanner
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12301G (1990) https://doi.org/10.1117/12.2294689
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
A research on ultrafast scanner in ps range is reported in this paper. It is based upon the self-induced deflection by passing the laser pulses through a semiconductor wedge. Its principle and computer simulation are presented. Using 'Inclined Surface Fourier Transform 'to consider deflection, diffraction and attenuation synthetically, computation results indicate that the attenuation worsens seriously the performances of this type of scanner. Effectual correction can be obtained by adding two special attenuators on both sides of the wedge.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ruilin Ma, Ruilin Ma, } "A research on ultrafast scanner", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301G (1 July 1990); doi: 10.1117/12.2294689; https://doi.org/10.1117/12.2294689
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