1 July 1990 Microcomputer-based speckle pattern imaging system
Author Affiliations +
Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12301K (1990) https://doi.org/10.1117/12.2294693
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
An automatic speckle pattern imaging system for measuring minute displacement without contact is presented in this paper. The system uses double-exposure method to produce the speckle pattern which is transformed into digital signal by CCD camera and A / D converter and then processed by a microcomputer -based imaging system for noise filtering, feature extraction and result display. The basic relation of the measurements, the system setup, the basic idea of the noise filtering and feature extraction are described, and the experimental results are given.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yaohuan Gong, "Microcomputer-based speckle pattern imaging system", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301K (1 July 1990); doi: 10.1117/12.2294693; https://doi.org/10.1117/12.2294693
PROCEEDINGS
3 PAGES


SHARE
Back to Top