1 July 1990 A high sensitivity picosecond optoelectronic sampling system
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12301P (1990) https://doi.org/10.1117/12.2294698
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
In this paper we describe an optoelectronic sampling system with time resolution of several ps and sensitivity of 10y v. It is an useful tool to measure the time characteristics of high speed photoelectronic or electronic devices.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xinan Guan, Xinan Guan, } "A high sensitivity picosecond optoelectronic sampling system", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301P (1 July 1990); doi: 10.1117/12.2294698; https://doi.org/10.1117/12.2294698
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