1 July 1990 Temperature mapping by double grating diffraction system with microcomputer image process
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12301W (1990) https://doi.org/10.1117/12.2294705
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
An improved method of temperature mapping by means of double grating diffraction System with microcomputer image processing technique is presented. The result of this method is satisfying.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jinhong Tu, "Temperature mapping by double grating diffraction system with microcomputer image process", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301W (1 July 1990); doi: 10.1117/12.2294705; https://doi.org/10.1117/12.2294705
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