1 July 1990 Optimization techniques for combination-matching of systematic accuracy of opto-electronic instrument
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12301X (1990) https://doi.org/10.1117/12.2294706
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
Allocation of accuracy index is an engineering problem of general significance in the layout design of the opto-electronic instrument. This paper, with achieving the lowest production cost as its aim, discusses the optimal combination-matching of the allocation of accuracy index. An automatic search algorithm and its application example are also provided. This paper as a whole unfolds the possibility of realizing automatic allocation of accuracy index.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Erqi Wang, Erqi Wang, } "Optimization techniques for combination-matching of systematic accuracy of opto-electronic instrument", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301X (1 July 1990); doi: 10.1117/12.2294706; https://doi.org/10.1117/12.2294706
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