1 July 1990 Computerized measurement of synthetic characteristics of microchannel plates
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 123024 (1990) https://doi.org/10.1117/12.2294713
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
A computerized measurement has been developed to assess the characteristics of microchannel plate (MCP). This paper discusses the microcomputer hardware and software techniques used in the system in circuit control, signal acquization and software package, etc.. Some measuring results have been presented.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yinghui Li, Yinghui Li, } "Computerized measurement of synthetic characteristics of microchannel plates", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123024 (1 July 1990); doi: 10.1117/12.2294713; https://doi.org/10.1117/12.2294713
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