1 July 1990 Measurement of the response time of ultrafast photoelectric detectors and dispersive broadening effect of connector with picosecond photoconductive sampling techniques
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 123029 (1990) https://doi.org/10.1117/12.2294718
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
For measured the response time of ultrafast detectors and some material, we have made one picosecond photoconductive sampling system, it consists of a mode-locked dye laser sysnchronously pumped by a mode -locked argon ion laser and a photoconductive switch using the SOS as substrate. This system has demonstrated a temporal reslution. of under 7 ps, offering a sensitivity of l0 uv
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuzhong Yuan, Shuzhong Yuan, } "Measurement of the response time of ultrafast photoelectric detectors and dispersive broadening effect of connector with picosecond photoconductive sampling techniques", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123029 (1 July 1990); doi: 10.1117/12.2294718; https://doi.org/10.1117/12.2294718
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