1 July 1990 UV photo-method for measurement of MCP characteristic parameters
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12302A (1990) https://doi.org/10.1117/12.2294719
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
In this paper, the measurement unit and the operating principle are introduced. The key problems are represented. The experimental results are given and peculiar advantages of this method are pointed out.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jingquan Tian, "UV photo-method for measurement of MCP characteristic parameters", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12302A (1 July 1990); doi: 10.1117/12.2294719; https://doi.org/10.1117/12.2294719
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