1 July 1990 Infrared CCD application in the equipment of circuit systems fault diagnosis
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12302L (1990) https://doi.org/10.1117/12.2294730
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
With the development of the electronic technology and with the improvement of the theory of circuit system fault diagnosis, many kinds of fault diagosis equipment have been designed. But the former equipment have a mortally drawback. The interchangeable property of its enterface between the test system and tested system is bad. If we use a uncontact interface, the drawback can be overcome. As we know, the devices in circuit have thermalradition when power on. So the whole circuit system can form a thermal image. The normal thermal image of circuit system is different from the unormal thermal image. By this principle, we can use a infrared CCD to get the thermal image and make a processing system(digital image processing system) to process this image. Then by computer, we'll compare the image of the normal system with the image of tested system, check the different, find the faults.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Li Yi, Li Yi, } "Infrared CCD application in the equipment of circuit systems fault diagnosis", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12302L (1 July 1990); doi: 10.1117/12.2294730; https://doi.org/10.1117/12.2294730
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