1 July 1990 A new method to laser-CCD scanning system applied to seamtracking
Author Affiliations +
Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 123038 (1990) https://doi.org/10.1117/12.2294753
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
In this paper, it is described that a new method to laser-CCD scanning system is applied to seamtracking. Theoretically, the deviation of the seam position can be determinied by comparing their real-time position with their references. The experiments show that the method take the precision of 0. lmm horizontally, and 0. 5mm vertically.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shiwen Xu, Shiwen Xu, } "A new method to laser-CCD scanning system applied to seamtracking", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123038 (1 July 1990); doi: 10.1117/12.2294753; https://doi.org/10.1117/12.2294753
PROCEEDINGS
2 PAGES


SHARE
Back to Top