Paper
1 July 1990 A new method of laser twice diffraction and interference for precisely measuring straightness of large-size objects
Yu Li
Author Affiliations +
Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12304C (1990) https://doi.org/10.1117/12.2294793
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
Straightness is an index which limits the deviation of an actul line from an ideal line. Properly mearuring straightness is a basic means to evaluate the precision condition of the shape and position of a machine part. Measurement of straightness is of great importance in a mechanical system. The problem of how to precisely measure straightness of a small-size object has been solved, but that of how to dynamically and automatically, and with high resolution, measure straightness of large- size objects is still being studied and tried. Now we present a new method of laser twice diffraction and inteference for measuring straightness, with a measuring range of dozens of meters, a resolution of ,u m order. This new method is of low cost and easy to get popularized.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu Li "A new method of laser twice diffraction and interference for precisely measuring straightness of large-size objects", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12304C (1 July 1990); https://doi.org/10.1117/12.2294793
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