1 July 1990 An analysis of pin-fet receiver sensitivity for Oeic design considerations
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12304Y (1990) https://doi.org/10.1117/12.2294815
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
An exact prediction of the sensitivity of a fiber-optic receiver is important for optical link analysis as well as for OEIC receiver design. For this purpose we have paid a special attention to ilze effect of flicker noise in PIN-MESFET optical receivers and have been able to improve the exactness of noise calculation significantly. This is the first intensive treatment of flicker noise ever publislzed in calculating the sensitivity of MESFET-based optical receiver. We first calculated the total input equivalent noise current which was then used for the calculation of peak power penalty caused by flicker noise. We have found that the flicker noise affects the sensitivity over a wide range of bit rates up to 1Gbitls. The calculated peak penalties were between 1 and 8dB in the case of high-impedance type receivers. In the case of transimpedance type receivers, the penalties were less than 2.2dB for noisy devices. The results of sensitivity calculation show excellent agreement with the performance data of commercially available PIN-FET receivers. The analysis also shows that there exist, for each given bit rate, an optimum feedback resistance, an open loop gain of front-end amplifier, a total input capacitance depending on photodiode capacitance, all of which are important circuit parameters in designing an OEIC receiver.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Moon-Soo Park, "An analysis of pin-fet receiver sensitivity for Oeic design considerations", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12304Y (1 July 1990); doi: 10.1117/12.2294815; https://doi.org/10.1117/12.2294815
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