1 July 1990 Talbot projection Moire topography and it's automatic fringe process using phase shift methods
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 123067 (1990) https://doi.org/10.1117/12.2294860
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
A novel profilometry---Talbot projection moire topography is demonstrated in this paper, which allows to take 3-D moire measurement under non-dark-room condition while the projecting lens can be eliminated. The moire contours are converted to 3-D data using phase shift methods with an image data processing system. The results of a fundamental experiment and its accuracy analysis are presented also.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ruowei Gu, "Talbot projection Moire topography and it's automatic fringe process using phase shift methods", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123067 (1 July 1990); doi: 10.1117/12.2294860; https://doi.org/10.1117/12.2294860
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