1 July 1990 Talbot projection Moire topography and it's automatic fringe process using phase shift methods
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 123067 (1990) https://doi.org/10.1117/12.2294860
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
A novel profilometry---Talbot projection moire topography is demonstrated in this paper, which allows to take 3-D moire measurement under non-dark-room condition while the projecting lens can be eliminated. The moire contours are converted to 3-D data using phase shift methods with an image data processing system. The results of a fundamental experiment and its accuracy analysis are presented also.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ruowei Gu, Ruowei Gu, } "Talbot projection Moire topography and it's automatic fringe process using phase shift methods", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123067 (1 July 1990); doi: 10.1117/12.2294860; https://doi.org/10.1117/12.2294860
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