1 July 1990 Feature extraction and processing of the signal in opto-electronic image measurement
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Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12306C (1990) https://doi.org/10.1117/12.2294865
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States
Abstract
Based on related bibliographys and repesences on the image measurement and the practise of author in science and technique research, this paper treat various methods for feature extraction and application for these methods. The indirect binary is a new concept for come up with author. It lends itself to on -line geometric size measurement for heat workpiece in furnace and for glass ribbon width or edge location in the molten tin bath using float process.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wanpeng Ji, "Feature extraction and processing of the signal in opto-electronic image measurement", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12306C (1 July 1990); doi: 10.1117/12.2294865; https://doi.org/10.1117/12.2294865
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