LWIR Detector Behavior At Very Low Frequencies

D. C. Arrington; W. L. Eisenman

doi:10.1117/12.955842

9 November 1977 LWIR Detector Behavior At Very Low Frequencies

D. C. Arrington, W. L. Eisenman

Proceedings Volume 0124, Modern Utilization of Infrared Technology III; (1977) https://doi.org/10.1117/12.955842
Event: 21st Annual Technical Symposium, 1977, San Diego, United States

Abstract

Measurements have recently been made of the signal and noise characteristics of extrinsic photoconductive silicon detectors. The measurements were made at several background levels, bias voltages and detector operating temperatures. Data are shown at modulation frequencies as low as 0.01 Hz, operating temperatures as low as 2.5K and background photon flux densities down to 8 x 107 photons/sec-cm2. Data on the temporal characteristics of the detector signal are presented. In addition, some interesting data on "spontaneous noise spikes" are also shown.

Citation Download Citation

D. C. Arrington and W. L. Eisenman "LWIR Detector Behavior At Very Low Frequencies", Proc. SPIE 0124, Modern Utilization of Infrared Technology III, (9 November 1977); https://doi.org/10.1117/12.955842

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