The CCD194 image sensor is described in terms of the high-performance, low-light-level, high-resolution applications (graphics, reconnaissance, and photogrammetry) for which it has been designed. The CCD194 design comprises two monolithic 6000 by 1 CCD image sensors in a body consisting of an aluminum header and an antireflective sapphire window. The photosite arrays are butted end-to-end and linearly aligned, separated by a distance of 20 microns. The peak-to-peak nonlinearity and nonplanarity are less than 15 microns for the entire 120-mm photosite span. A distance of 20 microns separates the arrays. The electrical characteristics of the device are tested; photosite transfer loss is measured. The results show a dynamic range of 15,000 to 1 with respect to rms noise, charge transfer inefficiency of 10 to the -6th/transfer, and a photoresponse nonuniformity of 15 percent. The line-scan imager is shown to function in high-performance, high-resolution, low-light-level applications. A 32 MHz effective data rate is provided by dual outputs on four chips.