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The application space for GaN devices is expanding. During our study of Vertical GaN device technology for power electronics, one of the phenomenal advancements was achieving a high-voltage, robust avalanche in p-n diodes. A high-quality p-n junction, although superficially simple, can be fundamentally limited in offering a uniform avalanche. Uniformity of avalanche is a critical parameter that is often overlooked during device designs and other metrics.
Bhawani Shankar,Ke Zeng, andSrabanti Chowdhury
"On uniform avalanche in III-nitrides and its application", Proc. SPIE 12430, Quantum Sensing and Nano Electronics and Photonics XIX, 1243002 (15 March 2023); https://doi.org/10.1117/12.2649674
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Bhawani Shankar, Ke Zeng, Srabanti Chowdhury, "On uniform avalanche in III-nitrides and its application," Proc. SPIE 12430, Quantum Sensing and Nano Electronics and Photonics XIX, 1243002 (15 March 2023); https://doi.org/10.1117/12.2649674