We report on a multi-year development effort demonstrating resonant cavity enhanced photodiodes (RCE-PDs) with an all-epitaxial architecture, exploiting the GaSb matched material system and its increasingly popular family of IR absorbers. RCE-PDs redefine the relationship between signal and noise generation within IR detectors, breaking some of the performance limits constraining conventional IR detectors. High performance RCE-PDs are achieved with resonance wavelengths from the SWIR to the LWIR, using GaSb/AlAsSb DBR mirrors and InGaAsSb, InAs, InAsSb and T2SL absorbers. Finally, we introduce a graded thickness RCE-PD which can perform the function of a spectrometer on a chip.
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