Design of APD focal plane detector test system for 3D imaging

HuaPing Ma; ShunHu Gu; ZunLie Tang; ChangHai He; ChangLin Li; Pu Zeng

doi:10.1117/12.2662216

12 April 2023 Design of APD focal plane detector test system for 3D imaging

HuaPing Ma, ShunHu Gu, ZunLie Tang, ChangHai He, ChangLin Li, Pu Zeng

Proceedings Volume 12565, Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022); 125651D (2023) https://doi.org/10.1117/12.2662216
Event: Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022), 2022, Shanghai, China

Abstract

In this paper, a key parameters test system of linear mode APD focal plane detector for laser three-dimensional imaging is designed. The test system includes signal processing circuit and optical calibration device, which is used for testing the key parameters such as the photo response nonuniformity, effective pixel rate, crosstalk of adjacent pixels, time resolution, etc. It is verified that the system can meet the key parameter test of linear mode APD focal plane detector, and the test repeatability error is less than 1%.

Citation Download Citation

HuaPing Ma, ShunHu Gu, ZunLie Tang, ChangHai He, ChangLin Li, and Pu Zeng "Design of APD focal plane detector test system for 3D imaging", Proc. SPIE 12565, Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022), 125651D (12 April 2023); https://doi.org/10.1117/12.2662216

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