High-resolution Shack-Hartmann wavefront sensing using LIFT

Rakchanok Rungsawang; Rafael Porcar; Xavier Levecq; Pauline Treimany

doi:10.1117/12.3005546

20 September 2023 High-resolution Shack-Hartmann wavefront sensing using LIFT

Rakchanok Rungsawang, Rafael Porcar, Xavier Levecq, Pauline Treimany

Proceedings Volume 12607, Optical Technology and Measurement for Industrial Applications Conference; 126070J (2023) https://doi.org/10.1117/12.3005546
Event: Optics and Photonics International Congress, 2023, Yokohama, Japan

Abstract

We will present a new approach of the linearized focal plane technique (LIFT), formerly developed by ONERA, which results in an improvement of a factor of 16 (4x4) of the spatial resolution. This technology is based on the combination of standard SH technology with phase retrieval algorithms applied on all spots of the microlens array that provides information on high spatial frequencies. We will show some measurements performed on extremely complex wavefronts. This technology presents very promising perspectives for optical and freeform metrology and can advantageously replace, at lower cost and better usability, Fizeau interferometry.

Citation Download Citation

Rakchanok Rungsawang, Rafael Porcar, Xavier Levecq, and Pauline Treimany "High-resolution Shack-Hartmann wavefront sensing using LIFT", Proc. SPIE 12607, Optical Technology and Measurement for Industrial Applications Conference, 126070J (20 September 2023); https://doi.org/10.1117/12.3005546

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