1 June 1990 New alignment system for submicron stepper
Author Affiliations +
Recent rapid progress in the semiconductor industry requires much better accuracy for overlay. Today, the overlay accuracy of 0.1 pm is discussed in reality. To guarantee the 0.1 pm overlay for all processes is one target. In order to attain such requirements, the alignment system has been renewed. We have developed a new TV image processing system with high resolution, using real-time twodimentional image processing technology by multi-computer system. Together with TV system, the new alignment system by HeCd and HeNe laser bright field method is implemented, and they showed more extensive flexibility to various types of wafers.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shunichi Uzawa, Shunichi Uzawa, Akiyoshi Suzuki, Akiyoshi Suzuki, Naoki Ayata, Naoki Ayata, "New alignment system for submicron stepper", Proc. SPIE 1261, Integrated Circuit Metrology, Inspection, and Process Control IV, (1 June 1990); doi: 10.1117/12.20058; https://doi.org/10.1117/12.20058

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