Fault analysis of power equipment based on infrared image

Yanhua Lei; Sen Wang; Wanhong Yu; Lingshuo Wang; Xiaotong Shi; Wenxuan Bao; Yifan Liu; Haoru Zheng; Aobo Jin

doi:10.1117/12.2675383

25 May 2023 Fault analysis of power equipment based on infrared image

Yanhua Lei, Sen Wang, Wanhong Yu, Lingshuo Wang, Xiaotong Shi, Wenxuan Bao, Yifan Liu, Haoru Zheng, Aobo Jin

Proceedings Volume 12636, Third International Conference on Machine Learning and Computer Application (ICMLCA 2022); 126362T (2023) https://doi.org/10.1117/12.2675383
Event: Third International Conference on Machine Learning and Computer Application (ICMLCA 2022), 2022, Shenyang, China

Abstract

The infrared thermal imaging technology plays a very important role in the current power system. This paper identifies the transformer in the infrared image according to its characteristics to form an image. Build the temperature field, get the highest, lowest and average temperatures of the equipment, compare with the database, and determine whether the electrical equipment has faults, the type and severity of faults.

Citation Download Citation

Yanhua Lei, Sen Wang, Wanhong Yu, Lingshuo Wang, Xiaotong Shi, Wenxuan Bao, Yifan Liu, Haoru Zheng, and Aobo Jin "Fault analysis of power equipment based on infrared image", Proc. SPIE 12636, Third International Conference on Machine Learning and Computer Application (ICMLCA 2022), 126362T (25 May 2023); https://doi.org/10.1117/12.2675383

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KEYWORDS

Infrared imaging

Infrared radiation

Thermography

Image segmentation

Transformers

Image processing

Image analysis

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