Optical classification of metal-milled samples using Fourier spectrum sampling

Christophe Gorecki

doi:10.1117/12.20249

1 August 1990 Optical classification of metal-milled samples using Fourier spectrum sampling

Christophe Gorecki

Proceedings Volume 1265, Industrial Inspection II; (1990) https://doi.org/10.1117/12.20249
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

An optical/digital approach to the classification of rough surfaces using Fourier spectrum sampling is described. The sampling of the 2-D Fourier spectrum is achieved with wedge ring detector which reduces an infinitely dimensioned spectrum image into a set of 64 measurements. To discriminate three metal milled samples in this reduced subspace we employ the Karhunen-Loève transformation. The classification procedure then selects automatically the best subspace from the K-L feature vectors.

Citation Download Citation

Christophe Gorecki "Optical classification of metal-milled samples using Fourier spectrum sampling", Proc. SPIE 1265, Industrial Inspection II, (1 August 1990); https://doi.org/10.1117/12.20249

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