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1 August 1990 Optical classification of metal-milled samples using Fourier spectrum sampling
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Proceedings Volume 1265, Industrial Inspection II; (1990)
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
An optical/digital approach to the classification of rough surfaces using Fourier spectrum sampling is described. The sampling of the 2-D Fourier spectrum is achieved with wedge ring detector which reduces an infinitely dimensioned spectrum image into a set of 64 measurements. To discriminate three metal milled samples in this reduced subspace we employ the Karhunen-Loève transformation. The classification procedure then selects automatically the best subspace from the K-L feature vectors.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christophe Gorecki "Optical classification of metal-milled samples using Fourier spectrum sampling", Proc. SPIE 1265, Industrial Inspection II, (1 August 1990);

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