Ellipsometric study of the growing crystal face

Andrew Y. Tronin

doi:10.1117/12.20280

1 August 1990 Ellipsometric study of the growing crystal face

Andrew Y. Tronin

Proceedings Volume 1266, In-Process Optical Measurements and Industrial Methods; (1990) https://doi.org/10.1117/12.20280
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

The growing face of LIJO3 crystal was studied by means of ellipsometry and interferometry . izi situ. Two phenomena were observed: the existence of solution boundary layer adjacent to the growing face and the formation of zonar defect structure of the crystal. The thickness of the boundary layer is estimated to be about 50 nm. Refraction index of the layer is 0. 02 higher than that of the bulk solution. The formation of zonar structure was observed in the form of spontaneous inclusion of quasi-two-dimensional layers in the growing crystal. Mean distance between them was estimated to be 10 aim. 2 .

Citation Download Citation

Andrew Y. Tronin "Ellipsometric study of the growing crystal face", Proc. SPIE 1266, In-Process Optical Measurements and Industrial Methods, (1 August 1990); https://doi.org/10.1117/12.20280

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