Using an automatic video inspection system to guarantee in-line film registration

William J. Burke III

doi:10.1117/12.20258

1 August 1990 Using an automatic video inspection system to guarantee in-line film registration

William J. Burke III

Proceedings Volume 1266, In-Process Optical Measurements and Industrial Methods; (1990) https://doi.org/10.1117/12.20258
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

The alignment of incoming material is one of the most crucial steps in the smooth and even flow of in-line processing systems for many applications. Examples include printed circuit board manufacturing in wave solder body alignment of automobiles for welding quarts or glass substrates for the production of diffraction gratings or lenses and fiber and cable extrusions. Many of these process flow environments use lasers or optical systems to insure accurate alignment immediately before the next processing step occurs. Another prime application involves using optical measuring to align film before deposition on the acetate film used as a substrate. A non-contact three-dimensional inspection system can be used for accurate alignment of the incoming film as well as providing correction constants to the deposition and/or film handling system. Along with the mechanical alignment the dimensional measurement system can find or recognize features or datums on the film to optimize positional alignment within the deposition area rather than only aligning to the relatively coarse position obtained by the using the film (substrate) edges and frame to frame markers. Interfacing the vision system to the external film handling system will be discussed along with the overall system design goals criteria and changes made during to empirical testing.

Citation Download Citation

William J. Burke III "Using an automatic video inspection system to guarantee in-line film registration", Proc. SPIE 1266, In-Process Optical Measurements and Industrial Methods, (1 August 1990); https://doi.org/10.1117/12.20258

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available